Alum Joel Greenberg (PhD '12, advisor: Gauthier), now research professor of Electrical and Computer Engineering, is involved in research to improve airport screening with x-ray diffraction. The team, which also includes Physics secondary Prof. Anuj Kapadia, primarily appointed in Radiology, demonstrated their technologies for U.S. Representative David Price last week. Read about more about "A Speedier and More Accurate Future for Airport Security Screening" here.
Photo: Joel Greenberg (left) with Representative David Price, Credit: Duke Pratt School of Engineering
